<?xml version="1.0" encoding="UTF-8"?>
<!DOCTYPE root>
<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" article-type="other" dtd-version="1.2" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">Journal of Communications Technology and Electronics</journal-id><journal-title-group><journal-title xml:lang="en">Journal of Communications Technology and Electronics</journal-title><trans-title-group xml:lang="ru"><trans-title>Радиотехника и электроника</trans-title></trans-title-group></journal-title-group><issn publication-format="print">0033-8494</issn><issn publication-format="electronic">3034-5901</issn><publisher><publisher-name xml:lang="en">The Russian Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="publisher-id">650491</article-id><article-id pub-id-type="doi">10.31857/S0033849423080053</article-id><article-id pub-id-type="edn">UWMFWQ</article-id><article-categories><subj-group subj-group-type="toc-heading"><subject>РАДИОФИЗИЧЕСКИЕ ЯВЛЕНИЯ В ТВЕРДОМ ТЕЛЕ И ПЛАЗМЕ</subject></subj-group><subj-group subj-group-type="article-type"><subject>Unknown</subject></subj-group></article-categories><title-group><article-title xml:lang="en">Propagation of Powerful Nano- and Subnanosecond Video Pulses in a Medium with Various Thermodynamic Characteristics</article-title><trans-title-group xml:lang="ru"><trans-title>Распространение мощных нано- и субнаносекундных видеоимпульсов в среде с меняющимися термодинамическими характеристиками</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Glazunov</surname><given-names>P. S.</given-names></name><name xml:lang="ru"><surname>Глазунов</surname><given-names>П. С.</given-names></name></name-alternatives><email>vdv@cplire.ru</email><xref ref-type="aff" rid="aff1"/><xref ref-type="aff" rid="aff2"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Vdovin</surname><given-names>V. A.</given-names></name><name xml:lang="ru"><surname>Вдовин</surname><given-names>В. А.</given-names></name></name-alternatives><email>vdv@cplire.ru</email><xref ref-type="aff" rid="aff2"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Saletskii</surname><given-names>A. M.</given-names></name><name xml:lang="ru"><surname>Салецкий</surname><given-names>А. М.</given-names></name></name-alternatives><email>vdv@cplire.ru</email><xref ref-type="aff" rid="aff1"/></contrib></contrib-group><aff-alternatives id="aff1"><aff><institution xml:lang="en">Moscow State University</institution></aff><aff><institution xml:lang="ru">Московский государственный университет им. М.В. Ломоносова</institution></aff></aff-alternatives><aff-alternatives id="aff2"><aff><institution xml:lang="en">Institute of Radioengineering and Electronics, Russian Academy of Sciences</institution></aff><aff><institution xml:lang="ru">Институт радиотехники и электроники им. В.А. Котельникова РАН</institution></aff></aff-alternatives><pub-date date-type="pub" iso-8601-date="2023-08-01" publication-format="electronic"><day>01</day><month>08</month><year>2023</year></pub-date><volume>68</volume><issue>8</issue><issue-title xml:lang="en"/><issue-title xml:lang="ru"/><fpage>817</fpage><lpage>826</lpage><history><date date-type="received" iso-8601-date="2025-01-31"><day>31</day><month>01</month><year>2025</year></date></history><permissions><copyright-statement xml:lang="en">Copyright ©; 2023, П.С. Глазунов, В.А. Вдовин, А.М. Салецкий</copyright-statement><copyright-statement xml:lang="ru">Copyright ©; 2023, П.С. Глазунов, В.А. Вдовин, А.М. Салецкий</copyright-statement><copyright-year>2023</copyright-year><copyright-holder xml:lang="en">П.С. Глазунов, В.А. Вдовин, А.М. Салецкий</copyright-holder><copyright-holder xml:lang="ru">П.С. Глазунов, В.А. Вдовин, А.М. Салецкий</copyright-holder></permissions><self-uri xlink:href="https://innoscience.ru/0033-8494/article/view/650491">https://innoscience.ru/0033-8494/article/view/650491</self-uri><abstract xml:lang="en"><p>A conservative model is proposed for a weakly conductive material medium with changing thermodynamic characteristics during the propagation of a pulse in it. Equations are obtained that describe the change in the shape of the profile of a video pulse propagating in a medium, as well as in nonlinear transmission lines with a temperature dependence of the permittivity. It is shown that if the temperature coefficient of the permittivity is negative, then the peak power of the pulse can increase with time; otherwise, the temperature dependence of the permittivity leads to an increase in attenuation.</p></abstract><trans-abstract xml:lang="ru"><p id="idm45181323923488">Предложена консервативная модель слабопроводящей материальной среды с меняющимися термодинамическими характеристиками в процессе распространения в ней импульса. Получены уравнения, описывающие изменение формы профиля видеоимпульса, распространяющегося в среде, а также в нелинейных линиях передачи с температурной зависимостью диэлектрической проницаемости. Показано, что если температурный коэффициент диэлектрической проницаемости отрицателен, то возможно увеличение пиковой мощности импульса с течением времени, в противном случае температурная зависимость диэлектрической проницаемости приводит к увеличению затухания.</p></trans-abstract><kwd-group xml:lang="en"><kwd>weakly conductive material medium</kwd><kwd>profile of a video pulse</kwd><kwd>temperature dependence of the permittivity</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Авторы статьи выражают благодарность В.В. Кулагину и В.А. Черепенину за ценные замечания по написанию данной статьи.</funding-statement></funding-group></article-meta></front><body></body><back><ref-list><ref id="B1"><label>1.</label><mixed-citation>Rukin S.N. // Rev. Sci. Instrum. 2020. V. 91. № 1. P. 011501. https://doi.org/10.1063/1.5128297</mixed-citation></ref><ref id="B2"><label>2.</label><mixed-citation>Gundersen M., Vernier P.T., Cronin S.B., Kerketta S. // IEEE Trans. 2020. V. PS-48. № 4. P. 742. https://doi.org/10.1109/TPS.2020.2972934</mixed-citation></ref><ref id="B3"><label>3.</label><mixed-citation>Senaj V., del Barrio Montañés A.A., Kramer T. et al. // JACoW IPAC. 2021. V. 21. P. 4454. https://doi.org/10.18429/JACoW-IPAC2021-THPAB340</mixed-citation></ref><ref id="B4"><label>4.</label><mixed-citation>Sokovnin S.Yu., Balezin M.E. // Radiation Phys. and Chem. 2018. V. 144. P. 265. https://doi.org/10.1016/j.radphyschem.2017.08.023</mixed-citation></ref><ref id="B5"><label>5.</label><mixed-citation>del Barrio Montañés A.A., Senaj V., Kramer T. et al. // J. Phys.: Conf. Ser. IOP Publ. 2023. V. 2420. № 1. P. 012085. https://doi.org/10.18429/JACoW-IPAC2022-THPOTK044</mixed-citation></ref><ref id="B6"><label>6.</label><mixed-citation>Jintao Q.I.U., Zhang C., Zehui L.I.U. et al. // Plasma Sci. Technol. 2021. V. 23. № 6. P. 064011. https://doi.org/10.1088/2058-6272/abf299</mixed-citation></ref><ref id="B7"><label>7.</label><mixed-citation>Komarskiy A.A., Korzhenevskiy S.R., Komarov N.A. // AIP Conf. Proc. 2020. V. 2250. № 1. P. 020018. https://doi.org/10.1063/5.0013238</mixed-citation></ref><ref id="B8"><label>8.</label><mixed-citation>Serguschichev K.A., Smirnov A.A., Ilyin V.A. et al. // J. Phys.: Conf. Ser. IOP Publ. 2019. V. 1410. № 1. P. 012237. https://doi.org/10.1088/1742-6596/1410/1/012237</mixed-citation></ref><ref id="B9"><label>9.</label><mixed-citation>Zhang J., Zhang D., Fan Y. et al. // Physics of Plasmas. 2020. V. 27. № 1. P. 010501. https://doi.org/10.1063/1.5126271</mixed-citation></ref><ref id="B10"><label>10.</label><mixed-citation>Fedorov V.M., Efanov M.V., Ostashev Ye.O. et al. // Electronics. 2021. V. 10. № 9. P. 1011. https://doi.org/10.3390/electronics10091011</mixed-citation></ref><ref id="B11"><label>11.</label><mixed-citation>Efremov A.M., Koshelev V.I., Kovalchuk B.M. et al. // Laser and Particle Beams. 2014. V. 32. № 3. P. 413. https://doi.org/10.1017/S0263034614000299</mixed-citation></ref><ref id="B12"><label>12.</label><mixed-citation>Singh S.K., Mitra S., Naresh P. et al. // Proc. 2014 Int. Conf. IEEE Int. Power Modulator and High Voltage Conf. Santa Fe. 1–5 Jun. 2014. P. 271. https://doi.org/10.1109/IPMHVC.2014.7287261</mixed-citation></ref><ref id="B13"><label>13.</label><mixed-citation>Ahajjam Y., Aghzout O., Catala-Civera J.M. et al. // Advanced Electromagnetics. 2019. V. 8. № 3. P. 76. https://doi.org/10.7716/aem.v8i3.676</mixed-citation></ref><ref id="B14"><label>14.</label><mixed-citation>Wen S., Wang M., Xie J., Wu D. // Microwave and Optical Technol. Lett. 2019. V. 61. № 4. P. 867. https://doi.org/10.1002/mop.31654</mixed-citation></ref><ref id="B15"><label>15.</label><mixed-citation>Ahmad V., Sobus J., Greenberg M. et al. // Nature Commun. 2020. V. 11. № 1. P. 4310. https://doi.org/10.1038/s41467-020-18094-4</mixed-citation></ref><ref id="B16"><label>16.</label><mixed-citation>Kozlov B.A., Makhanko D.S., Seredinov V.I., Pyanchenkov S.A. // J. Phys.: Conf. Ser. IOP Publ. 2019. V. 1393. № 1. P. 012010. https://doi.org/10.1088/1742-6596/1393/1/012010</mixed-citation></ref><ref id="B17"><label>17.</label><mixed-citation>Kozlov B., Makhan’ko D., Seredinov V. // Proc. 2020 Int. Conf. 7th Intern. Congr. on Energy Fluxes and Radiation Effects IEEE. Tomsk. Russia. 14–16 Sept. 2020. P. 621. https://doi.org/10.1109/EFRE47760.2020.9241987</mixed-citation></ref><ref id="B18"><label>18.</label><mixed-citation>Катаев И.Г. Ударные электромагнитные волны. М.: Сов. радио, 1963.</mixed-citation></ref><ref id="B19"><label>19.</label><mixed-citation>Островский Л.А. // ЖТФ. 1963. Т. 33. № 9. С. 1080.</mixed-citation></ref><ref id="B20"><label>20.</label><mixed-citation>Гапонов А.В., Островский Л.А., Фрейдман Г.И. // Изв. вузов. Радиофизика. 1967. Т. 10. № 9–10. С. 1376.</mixed-citation></ref><ref id="B21"><label>21.</label><mixed-citation>Месяц Г.А. Импульсная энергетика и электроника. М.: Наука, 2004. Гл. 23.</mixed-citation></ref><ref id="B22"><label>22.</label><mixed-citation>Driessen A.B.J.M., Beckers F.J.C.M., Huiskamp T., Pemen A.J.M. // IEEE Trans. 2017. V. PS-45. № 12. C. 3288. https://doi.org/10.1109/TPS.2017.2771275</mixed-citation></ref><ref id="B23"><label>23.</label><mixed-citation>Gusev A.I., Pedos M.S., Ponomarev A.V. et al. // Rev. Sci. Instrum. 2018. V. 89. № 9. P. 094703. https://doi.org/10.1063/1.5048111</mixed-citation></ref><ref id="B24"><label>24.</label><mixed-citation>Huang L., Meng J., Zhu D. et al. // IEEE Trans. 2020. V. PS-48. № 11. P. 3847. https://doi.org/10.1109/TPS.2020.3029524</mixed-citation></ref><ref id="B25"><label>25.</label><mixed-citation>Gao J., Li S., Shi C. et al. // Rev. Sci. Instrum. 2019. V. 90. № 1. P. 014704. https://doi.org/10.1063/1.5053780</mixed-citation></ref><ref id="B26"><label>26.</label><mixed-citation>Karelin S.Y., Krasovitsky V.B., Magda I.I. et al. // Problems of Atomic Sci. Technol. 2019. P. 65. https://doi.org/10.46813/2019-122-065</mixed-citation></ref><ref id="B27"><label>27.</label><mixed-citation>Priputnev P., Romanchenko I., Tarakanov V., Pegel I. // Proc. 2020 7th Int. Congr. on Energy Fluxes and Radiation Effects (EFRE). Tomsk. 14–16 Sept. N.Y.: IEEE, 2020. P. 434. https://doi.org/10.1109/EFRE47760.2020.9241904</mixed-citation></ref><ref id="B28"><label>28.</label><mixed-citation>Ulmaskulov M.R., Shunailov S.A., Sharypov K.A., Yalandin M.I. // J. Appl. Phys. 2019. V. 126. № 8. Article No. 084504. https://doi.org/10.1063/1.5110438</mixed-citation></ref><ref id="B29"><label>29.</label><mixed-citation>Alichkin E.A., Pedos M.S., Ponomarev A.V. et al. // Rev. Sci. Instrum. 2020. V. 91. № 10. P. 104705. https://doi.org/10.1063/5.0017980</mixed-citation></ref><ref id="B30"><label>30.</label><mixed-citation>Fairbanks A.J., Darr A.M., Garner A.L. // IEEE Access. 2020. V. 8. P. 148606. https://doi.org/10.1109/ACCESS.2020.3015715</mixed-citation></ref><ref id="B31"><label>31.</label><mixed-citation>Alpert Y., Jerby E. // IEEE Trans. 1999. V. PS-27. № 2. P. 555. https://doi.org/10.1109/27.772285</mixed-citation></ref><ref id="B32"><label>32.</label><mixed-citation>Zhong J., Liang S., Yuan Y., Xiong Q. // IEEE Trans. 2016. V. MTT-64. № 8. P. 2467. https://doi.org/10.1109/TMTT.2016.2584613</mixed-citation></ref><ref id="B33"><label>33.</label><mixed-citation>Sid A., Debbache D., Bendib A. // Phys. of Plasmas. 2006. V. 13. № 8. P. 083107. https://doi.org/10.1063/1.2219431</mixed-citation></ref><ref id="B34"><label>34.</label><mixed-citation>Andreev N.E., Courtois C., Cros B. et al. // Phys. Rev. E. 2001. V. 64. № 1. P. 016404. https://doi.org/10.1103/PhysRevE.64.016404</mixed-citation></ref><ref id="B35"><label>35.</label><mixed-citation>Tuev P.V., Lotov K.V. // JOSA A. 2021. V. 38. № 1. P. 108. https://doi.org/10.1364/JOSAA.410552</mixed-citation></ref><ref id="B36"><label>36.</label><mixed-citation>Peñano J.R., Sprangle P., Hafizi B. et al. // Phys. Rev. E. 2005. V. 72. № 3. P. 036412. https://doi.org/10.1103/PhysRevE.72.036412</mixed-citation></ref><ref id="B37"><label>37.</label><mixed-citation>Petrov G.M., Davis J. // J. Phys. B: Atomic, Molecular and Optical Physics. 2008. V. 41. № 2. P. 025601. https://doi.org/10.1088/0953-4075/41/2/025601</mixed-citation></ref><ref id="B38"><label>38.</label><mixed-citation>Ovchinnikov K.N., Uryupin S.A. // Contributions to Plasma Phys. 2019. V. 59. № 7. P. e201800119. https://doi.org/10.1002/ctpp.201800119</mixed-citation></ref><ref id="B39"><label>39.</label><mixed-citation>Grigorovich D.A., Ovchinnikov K.N., Uryupin S.A. // Plasma Phys. Rep. 2022. V. 48. № 11. P. 1156. https://doi.org/10.1134/S1063780X22601286</mixed-citation></ref><ref id="B40"><label>40.</label><mixed-citation>Рез И.С., Поплавко Ю.М. Диэлектрики: основные свойства и применения в электронике. РиС, 1989.</mixed-citation></ref><ref id="B41"><label>41.</label><mixed-citation>Квасников И.А. Термодинамика и статистическая физика. Т. 1. Теория равновесных систем: Термодинамика. М.: Едиториал УРСС, 2002.</mixed-citation></ref><ref id="B42"><label>42.</label><mixed-citation>Ахманов С.А. // Успехи физ. наук. 1986. Т. 149. № 7. С. 361.</mixed-citation></ref><ref id="B43"><label>43.</label><mixed-citation>Silaghi M.A. Dielectric Material. 2012. https://doi.org/10.5772/50638</mixed-citation></ref><ref id="B44"><label>44.</label><mixed-citation>Иоссель Ю.Я., Кочанов Э.С., Струнский М.Г. Расчет электрической емкости. Л.: Энергоиздат, 1981. С. 147.</mixed-citation></ref><ref id="B45"><label>45.</label><mixed-citation>Калантаров П.Л., Цейтлин Л.А. Расчет индуктивностей. Л.:Энергоатомиздат, 1986. С. 132.</mixed-citation></ref><ref id="B46"><label>46.</label><mixed-citation>Krupka J., Derzakowski K., Riddle B., Baker-Jarvis J. // Measurement Sci. Technol. 1998. V. 9. № 10. P. 1751. https://doi.org/10.1088/0957-0233/9/10/015</mixed-citation></ref><ref id="B47"><label>47.</label><mixed-citation>Глазунов П.С., Вдовин В.А., Слепков А.И. // Журн. радиоэлектроники. 2019. № 2. https://doi.org/10.30898/1684-1719.2019.2.1</mixed-citation></ref><ref id="B48"><label>48.</label><mixed-citation>Savage M.E., Bennett L.F., Bliss D.E. et al. // Proc. 2007 16th IEEE Int. Pulsed Power Conf. Albuquerque 17–22 Jun. 2007. N.Y.: IEEE, 2007. V. 2. P. 979. https://doi.org/10.1109/PPPS.2007.4652354</mixed-citation></ref><ref id="B49"><label>49.</label><mixed-citation>Luo T., Shan X., Zhao J. et al. // J. Amer. Ceramic Soc. 2019. V. 102. № 7. P. 3849. https://doi.org/10.1111/jace.16415</mixed-citation></ref><ref id="B50"><label>50.</label><mixed-citation>de Ligny D., Richet P. // Phys. Rev. B. 1996. V. 53. № 6. P. 3013. https://doi.org/10.1103/PhysRevB.53.3013</mixed-citation></ref></ref-list></back></article>
