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<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" article-type="research-article" dtd-version="1.2" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">Journal of Communications Technology and Electronics</journal-id><journal-title-group><journal-title xml:lang="en">Journal of Communications Technology and Electronics</journal-title><trans-title-group xml:lang="ru"><trans-title>Радиотехника и электроника</trans-title></trans-title-group></journal-title-group><issn publication-format="print">0033-8494</issn><issn publication-format="electronic">3034-5901</issn><publisher><publisher-name xml:lang="en">The Russian Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="publisher-id">692012</article-id><article-id pub-id-type="doi">10.7868/S3034590125070075</article-id><article-categories><subj-group subj-group-type="toc-heading"><subject>НАНОЭЛЕКТРОНИКА</subject></subj-group><subj-group subj-group-type="article-type"><subject>Research Article</subject></subj-group></article-categories><title-group><article-title xml:lang="en">Features of the cellular microstructures formation in iron-garnet films using focused ion beam etching</article-title><trans-title-group xml:lang="ru"><trans-title>Особенности формирования ячеистых микроструктур в пленках ферритов-гранатов методом ионно-лучевого травления</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Fedorova</surname><given-names>A. A.</given-names></name><name xml:lang="ru"><surname>Федорова</surname><given-names>А. А.</given-names></name></name-alternatives><email>danilova.aa@phystech.edu</email><xref ref-type="aff" rid="aff1"/><xref ref-type="aff" rid="aff2"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Orlov</surname><given-names>A. P.</given-names></name><name xml:lang="ru"><surname>Орлов</surname><given-names>А. П.</given-names></name></name-alternatives><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Nikitov</surname><given-names>S. A.</given-names></name><name xml:lang="ru"><surname>Никитов</surname><given-names>С. А.</given-names></name></name-alternatives><xref ref-type="aff" rid="aff1"/><xref ref-type="aff" rid="aff2"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Logunov</surname><given-names>M. V.</given-names></name><name xml:lang="ru"><surname>Логунов</surname><given-names>М. В.</given-names></name></name-alternatives><xref ref-type="aff" rid="aff1"/><xref ref-type="aff" rid="aff2"/><xref ref-type="aff" rid="aff3"/></contrib></contrib-group><aff-alternatives id="aff1"><aff><institution xml:lang="en">Kotelnikov Institute of Radioengineering and Electronics RAS</institution></aff><aff><institution xml:lang="ru">Институт радиотехники и электроники им. В.А. Котельникова РАН</institution></aff></aff-alternatives><aff-alternatives id="aff2"><aff><institution xml:lang="en">Moscow Institute of Physics and Technology (National Research University)</institution></aff><aff><institution xml:lang="ru">Московский физико-технический институт (национальный исследовательский университет)</institution></aff></aff-alternatives><aff-alternatives id="aff3"><aff><institution xml:lang="en">National Research University Higher School of Economics</institution></aff><aff><institution xml:lang="ru">Национальный исследовательский университет «Высшая школа экономики»</institution></aff></aff-alternatives><pub-date date-type="pub" iso-8601-date="2025-07-15" publication-format="electronic"><day>15</day><month>07</month><year>2025</year></pub-date><volume>70</volume><issue>7</issue><issue-title xml:lang="en">VOL 70, NO7 (2025)</issue-title><issue-title xml:lang="ru">ТОМ 70, №7 (2025)</issue-title><fpage>683</fpage><lpage>688</lpage><history><date date-type="received" iso-8601-date="2025-10-04"><day>04</day><month>10</month><year>2025</year></date></history><permissions><copyright-statement xml:lang="en">Copyright ©; 2025, Russian Academy of Sciences</copyright-statement><copyright-statement xml:lang="ru">Copyright ©; 2025, Российская академия наук</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="en">Russian Academy of Sciences</copyright-holder><copyright-holder xml:lang="ru">Российская академия наук</copyright-holder><ali:free_to_read xmlns:ali="http://www.niso.org/schemas/ali/1.0/" start_date="2026-07-15"/></permissions><self-uri xlink:href="https://innoscience.ru/0033-8494/article/view/692012">https://innoscience.ru/0033-8494/article/view/692012</self-uri><abstract xml:lang="en"><p>The results of cellular microstructures formation in dielectric iron-garnet films are presented. We used local surface modification (etching) by focused ion beam lithography. It is shown that using a scanning electron microscope along with an ion column is effective to compensate for the surface charge while etching in iron garnets. This method does not require an additional sputtering of conductive layer onto the garnet film. The etching depth must be more than half of the initial film thickness for implementation of a monodomain state inside the cells, At the same time, the size of the initial domain structure in the film must be taken into account when choosing the lateral cell sizes.</p></abstract><trans-abstract xml:lang="ru"><p>Представлены результаты формирования ячеистых микроструктур в диэлектрических пленках ферритов-гранатов с использованием локальной модификации поверхности (травления) пленок с помощью сфокусированного ионного пучка. Показано, что для компенсации возникающего в процессе травления поверхностного заряда в ферритах-гранатах эффективно использование сканирующего электронного микроскопа одновременно при работе с ионной колонной, причем без предварительного напыления на пленку дополнительного проводящего слоя. Для реализации внутри ячеек монодоменного состояния глубина травления должна составлять более половины исходной толщины пленки, а при выборе латеральных размеров ячеек необходимо учитывать размеры исходной доменной структуры в пленке.</p></trans-abstract><kwd-group xml:lang="en"><kwd>iron garnet</kwd><kwd>magneto-optics materials</kwd><kwd>cellular microstructures</kwd><kwd>domain structure</kwd><kwd>focused ion beam</kwd><kwd>dielectrics</kwd><kwd>surface charge</kwd></kwd-group><kwd-group xml:lang="ru"><kwd>феррит-гранат</kwd><kwd>магнитооптические материалы</kwd><kwd>ячеистые микроструктуры</kwd><kwd>доменная структура</kwd><kwd>фокусированный ионный пучок</kwd><kwd>диэлектрик</kwd><kwd>поверхностный заряд</kwd></kwd-group></article-meta></front><body></body><back><ref-list><ref id="B1"><label>1.</label><mixed-citation>Flebus B., Grundler D., Rana B., et al. // J. Phys.: Cond. Matt. 2024. V. 36. № 36. P. 363501.</mixed-citation></ref><ref id="B2"><label>2.</label><mixed-citation>Petti D., Tacchi S., Albisetti E. // J. Phys. D: Appl. Phys. 2022. V. 55. № 29. P. 293003.</mixed-citation></ref><ref id="B3"><label>3.</label><mixed-citation>Kharratian S., Urey H., Onbaşlı M.C. // Adv. Opt. Mater. 2020. V. 8. № 1. P. 1901381.</mixed-citation></ref><ref id="B4"><label>4.</label><mixed-citation>Logunov M.V., Safonov S.S., Fedorov A.S., et al. // Phys. Rev. Appl. 2021. V. 15. № 6. P. 064024.</mixed-citation></ref><ref id="B5"><label>5.</label><mixed-citation>Aoshima K., Funabashi N., Higashida R. et al. // Opt. Express. 2023. V. 31. № 13. P. 21330.</mixed-citation></ref><ref id="B6"><label>6.</label><mixed-citation>Blank T.G.H., Mashkovich E.A., Grishunin K.A. et al. // Phys. Rev. B. 2023. V. 108. № 9. P. 094439.</mixed-citation></ref><ref id="B7"><label>7.</label><mixed-citation>Ignatyeva D.O., Karki D., Voronov A.A. et al // Nature Commun. 2020. V. 11. № 1. P. 5487.</mixed-citation></ref><ref id="B8"><label>8.</label><mixed-citation>Kim S.K., Beach G.S.D., Lee K.-J. et al. // Nature Materials. 2022. V. 21. № 1. P. 24.</mixed-citation></ref><ref id="B9"><label>9.</label><mixed-citation>Kharratian S., Urey H., Onbaşlı M.C. // Sci. Rep. 2019. V. 9. № 1. P. 644.</mixed-citation></ref><ref id="B10"><label>10.</label><mixed-citation>Higashida R., Kawana M., Aoshima K., Funabashi N. // Proc. Optica Imaging Congr. 3D Image Acquisition and Display. Boston, 2023. N.Y.: Optica Publ. Group, 2023. P. JTu4A.47.</mixed-citation></ref><ref id="B11"><label>11.</label><mixed-citation>Лузанов В.А., Балашов В.В., Лопухин К.В. // РЭ. 2022. Т. 67. № 6. С. 612.</mixed-citation></ref><ref id="B12"><label>12.</label><mixed-citation>Schlitz R., Helm T., Lammel M. et al. // Appl. Phys. Lett. 2019. V. 114. № 25. P. 252401.</mixed-citation></ref><ref id="B13"><label>13.</label><mixed-citation>Yao N. Focused Ion Beam Systems: Basics and Applications. Cambridge: Univ. Press, 2007</mixed-citation></ref><ref id="B14"><label>14.</label><mixed-citation>Vernon-Parry K.D. // III–Vs Rev. 2000. V. 13. № 4. P. 40.</mixed-citation></ref><ref id="B15"><label>15.</label><mixed-citation>Фролов А.В., Синченко А.А., Орлов А.П. et al. // Нелинейный мир. 2017. Т. 15. № 2. С. 39.</mixed-citation></ref><ref id="B16"><label>16.</label><mixed-citation>Latyshev Y., Smolovich A., Orlov A. et al.// Nanosci. Nanoeng. 2015. V. 3. № 2. P. 13.</mixed-citation></ref><ref id="B17"><label>17.</label><mixed-citation>Мамонов Е.А., Новиков В.Б., Майдыковский А.И. et al. // ЖЭТФ. 2023. Т. 163. № 1. С. 41.</mixed-citation></ref><ref id="B18"><label>18.</label><mixed-citation>Vansteenkiste A., Leliaert J., Dvornik M. и др. // AIP Advances. 2014. V. 4. № 10. P. 107133.</mixed-citation></ref><ref id="B19"><label>19.</label><mixed-citation>Leliaert J., Dvornik M., Mulkers J. et al. // J. Phys. D: Appl. Phys. 2018. V. 51. № 12. P. 123002.</mixed-citation></ref></ref-list></back></article>
