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<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:ali="http://www.niso.org/schemas/ali/1.0/" article-type="research-article" dtd-version="1.2" xml:lang="en"><front><journal-meta><journal-id journal-id-type="publisher-id">Journal of Communications Technology and Electronics</journal-id><journal-title-group><journal-title xml:lang="en">Journal of Communications Technology and Electronics</journal-title><trans-title-group xml:lang="ru"><trans-title>Радиотехника и электроника</trans-title></trans-title-group></journal-title-group><issn publication-format="print">0033-8494</issn><issn publication-format="electronic">3034-5901</issn><publisher><publisher-name xml:lang="en">The Russian Academy of Sciences</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="publisher-id">696910</article-id><article-id pub-id-type="doi">10.7868/S3034590125100139</article-id><article-categories><subj-group subj-group-type="toc-heading" xml:lang="en"><subject>TO THE 70th ANNIVERSARY OF THE KOTELNIKOV IRE RAS</subject></subj-group><subj-group subj-group-type="toc-heading" xml:lang="ru"><subject>К 70-ЛЕТИЮ ФИРЭ им. В.А. КОТЕЛЬНИКОВА РАН</subject></subj-group><subj-group subj-group-type="article-type"><subject>Research Article</subject></subj-group></article-categories><title-group><article-title xml:lang="en">Comparison of annealing schemes of Yb: YAG and Yb: LuAG ceramics after hot isostatic pressing</article-title><trans-title-group xml:lang="ru"><trans-title>Сравнение методик отжига образцов керамики Yb: YAG и Yb: LuAG после горячего изостатического прессования</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Lopukhin</surname><given-names>K. V.</given-names></name><name xml:lang="ru"><surname>Лопухин</surname><given-names>К. В.</given-names></name></name-alternatives><email>kvl215@fireras.su</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Balashov</surname><given-names>V. V.</given-names></name><name xml:lang="ru"><surname>Балашов</surname><given-names>В. В.</given-names></name></name-alternatives><email>kvl215@fireras.su</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Efimov</surname><given-names>A. A.</given-names></name><name xml:lang="ru"><surname>Ефимов</surname><given-names>А. А.</given-names></name></name-alternatives><email>kvl215@fireras.su</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Kozlova</surname><given-names>S. M.</given-names></name><name xml:lang="ru"><surname>Козлова</surname><given-names>С. М.</given-names></name></name-alternatives><email>kvl215@fireras.su</email><xref ref-type="aff" rid="aff1"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Gerke</surname><given-names>M. N.</given-names></name><name xml:lang="ru"><surname>Герке</surname><given-names>М. Н.</given-names></name></name-alternatives><email>kvl215@fireras.su</email><xref ref-type="aff" rid="aff2"/></contrib><contrib contrib-type="author"><name-alternatives><name xml:lang="en"><surname>Kochuev</surname><given-names>D. A.</given-names></name><name xml:lang="ru"><surname>Кочуев</surname><given-names>Д. А.</given-names></name></name-alternatives><email>kvl215@fireras.su</email><xref ref-type="aff" rid="aff2"/></contrib></contrib-group><aff-alternatives id="aff1"><aff><institution xml:lang="en">Fryazino Branch of the Kotelnikov Institute of Radioengineering and Electronics RAS</institution></aff><aff><institution xml:lang="ru">Фрязинский филиал Института радиотехники и электроники им. В.А. Котельникова РАН</institution></aff></aff-alternatives><aff-alternatives id="aff2"><aff><institution xml:lang="en">Vladimir State University named after Alexander and Nikolay Stoletovs</institution></aff><aff><institution xml:lang="ru">Владимирский государственный университет им. А.Г. и Н.Г. Столетовых</institution></aff></aff-alternatives><pub-date date-type="pub" iso-8601-date="2025-10-15" publication-format="electronic"><day>15</day><month>10</month><year>2025</year></pub-date><volume>70</volume><issue>10</issue><issue-title xml:lang="en">VOL 70, NO10 (2025)</issue-title><issue-title xml:lang="ru">ТОМ 70, №10 (2025)</issue-title><fpage>989</fpage><lpage>996</lpage><history><date date-type="received" iso-8601-date="2025-11-24"><day>24</day><month>11</month><year>2025</year></date></history><permissions><copyright-statement xml:lang="en">Copyright ©; 2025, Russian Academy of Sciences</copyright-statement><copyright-statement xml:lang="ru">Copyright ©; 2025, Российская академия наук</copyright-statement><copyright-year>2025</copyright-year><copyright-holder xml:lang="en">Russian Academy of Sciences</copyright-holder><copyright-holder xml:lang="ru">Российская академия наук</copyright-holder></permissions><self-uri xlink:href="https://innoscience.ru/0033-8494/article/view/696910">https://innoscience.ru/0033-8494/article/view/696910</self-uri><abstract xml:lang="en"><p>The Yb: YAG and Yb: LuAG ceramic samples with the SiO2+B2O3 sintering additives, as well as the Yb: YAG ceramic samples with the CaO+MgO sintering additives, were obtained by reactive vacuum presintering at different temperatures followed by hot isostatic pressing (HIP) with different annealing schemes used after HIP. The optimal presintering conditions were determined, the effect of the sintering additives on the structural and optical properties of the samples was studied. The optical transmission of the samples was investigated, and the average grain size was measured. It was found that the optimal presintering temperature for Yb: YAG samples with the SiO2+B2O3 sintering additives is below 1500 °C, with CaO+MgO – in the range of 1700–1750 °C, and for Yb: LuAG samples with the SiO2+B2O3 sintering additives – in the range of 1500–1600 °C. To achieve the best optical characteristics, samples with SiO2+B2O3 sintering additives must be annealed first in vacuum and then in air after HIP. In the case of composition with CaO+MgO sintering additives, additional annealing after HIP leads to a loss of transparency by the samples.</p></abstract><trans-abstract xml:lang="ru"><p>Получены образцы керамики Yb: YAG и Yb: LuAG со спекающими добавками SiO2+B2O3, а также образцы керамики Yb: YAG со спекающими добавками CaO+MgO путем реактивного вакуумного предспекания при различных температурах с последующим горячим изостатическим прессованием (ГИП) и с использованием различных схем отжига после ГИП. Определены оптимальные условия предспекания, изучено влияние спекающих добавок на структурные и оптические свойства образцов. Исследовано оптическое пропускание образцов, проведены измерения среднего размера зерен. Установлено, что оптимальная температура предспекания образцов Yb: YAG со спекающими добавками SiO2+B2O3 находится ниже 1500 °C, с CaO+MgO – в диапазоне 1700–1750 °C, а Yb: LuAG со спекающими добавками SiO2+B2O3 – в диапазоне 1500–1600 °C. Образцы составов с SiO2+B2O3 для достижения наилучших оптических характеристик необходимо после ГИП отжигать сначала в вакууме, а затем на воздухе. В случае состава с CaO+MgO дополнительные отжиги после ГИП приводят к потере образцами прозрачности.</p></trans-abstract><kwd-group xml:lang="en"><kwd>ceramics</kwd><kwd>YAG</kwd><kwd>LuAG</kwd><kwd>HIP</kwd><kwd>sintering aids</kwd><kwd>annealing</kwd></kwd-group><kwd-group xml:lang="ru"><kwd>керамика</kwd><kwd>YAG</kwd><kwd>LuAG</kwd><kwd>ГИП</kwd><kwd>спекающие добавки</kwd><kwd>отжиг</kwd></kwd-group><funding-group><funding-statement xml:lang="ru">Работа выполнена в рамках государственного задания ИРЭ им. Котельникова РАН по теме № 075-00395-25-00.</funding-statement></funding-group></article-meta></front><body></body><back><ref-list><ref id="B1"><label>1.</label><mixed-citation>Ikesue A., Kinoshita T., Kamata K. et al. // J. Amer. Ceram. Soc. 1995. V. 78. № 4. P. 1033.</mixed-citation></ref><ref id="B2"><label>2.</label><mixed-citation>doi.org/10.1111/j.1151-2916.1995.tb08433.x</mixed-citation></ref><ref id="B3"><label>3.</label><mixed-citation>Ikesue A., Aung Y.L. // Nature Photonics. 2008. V. 2. № 12. P. 721.</mixed-citation></ref><ref id="B4"><label>4.</label><mixed-citation>doi.org/10.1038/nphoton.2008.243</mixed-citation></ref><ref id="B5"><label>5.</label><mixed-citation>Lu J., Ueda K., Yagi H. et al. // J. Alloys Compd. 2002. V. 341. № 1–2. P. 220.</mixed-citation></ref><ref id="B6"><label>6.</label><mixed-citation>doi.org/10.1016/S0925-8388(02)00083-X</mixed-citation></ref><ref id="B7"><label>7.</label><mixed-citation>Ikesue A., Aung Y.L., Taira T. et al. // Annual Rev. Mater. Res. 2006. V. 36. № 1. P. 397.</mixed-citation></ref><ref id="B8"><label>8.</label><mixed-citation>doi.org/10.1146/annurev.matsci.36.011205.152926</mixed-citation></ref><ref id="B9"><label>9.</label><mixed-citation>Brenier A., Boulon G. // J. Alloys Compd. 2001. V. 323–324. P. 210.</mixed-citation></ref><ref id="B10"><label>10.</label><mixed-citation>doi.org/10.1016/S0925-8388(01)01112-4</mixed-citation></ref><ref id="B11"><label>11.</label><mixed-citation>Dong J., Ueda K., Yagi H. et al. // Laser Phys. Let. 2009. V. 6. № 4. P. 282.</mixed-citation></ref><ref id="B12"><label>12.</label><mixed-citation>doi.org/10.1002/lapl.200810136</mixed-citation></ref><ref id="B13"><label>13.</label><mixed-citation>Luo D., Zhang J., Xu C. et al. // Opt. Mater. 2012. V. 34. № 6. P. 936.</mixed-citation></ref><ref id="B14"><label>14.</label><mixed-citation>doi.org/10.1016/j.optmat.2011.04.017</mixed-citation></ref><ref id="B15"><label>15.</label><mixed-citation>Tang F., Cao Y., Guo W. et al. // Opt. Mater. 2011. V. 33. № 8. P. 1278.</mixed-citation></ref><ref id="B16"><label>16.</label><mixed-citation>doi.org/10.1016/j.optmat.2011.02.049</mixed-citation></ref><ref id="B17"><label>17.</label><mixed-citation>Wu Y., Li J., Pan Y. et al. // J. Amer. Ceram. Soc. 2007. V. 90. № 10. P. 3334.</mixed-citation></ref><ref id="B18"><label>18.</label><mixed-citation>doi.org/10.1111/j.1551-2916.2007.01885.x</mixed-citation></ref><ref id="B19"><label>19.</label><mixed-citation>Luo D., Zhang J., Xu C. et al. // Opt. Mater. Express. 2012. V. 2. № 10. P. 1425.</mixed-citation></ref><ref id="B20"><label>20.</label><mixed-citation>doi.org/10.1364/OME.2.001425</mixed-citation></ref><ref id="B21"><label>21.</label><mixed-citation>Ikesue A., Furusato I., Kamata K. // J. Amer. Ceram. Soc. 1995. V. 78. № 1. P. 225.</mixed-citation></ref><ref id="B22"><label>22.</label><mixed-citation>doi.org/10.1111/j.1151-2916.1995.tb08389.x</mixed-citation></ref><ref id="B23"><label>23.</label><mixed-citation>Awaad M. // J. Ceram. Sci. Technol. 2012. V. 3. № 1. P. 35.</mixed-citation></ref><ref id="B24"><label>24.</label><mixed-citation>doi.org/10.4416/JCST2012-00043</mixed-citation></ref><ref id="B25"><label>25.</label><mixed-citation>Frage N., Kalabukhov S., Sverdlov N. et al. // Ceram. Int. 2012. V. 38. № 7. P. 5513.</mixed-citation></ref><ref id="B26"><label>26.</label><mixed-citation>doi.org/10.1016/j.ceramint.2012.03.066</mixed-citation></ref><ref id="B27"><label>27.</label><mixed-citation>Frage N., Kalabukhov S., Sverdlov N. et al. // J. Europ. Ceram. Soc. 2010. V. 30. № 16. P. 3331.</mixed-citation></ref><ref id="B28"><label>28.</label><mixed-citation>doi.org/10.1016/j.jeurceramsoc.2010.08.006</mixed-citation></ref><ref id="B29"><label>29.</label><mixed-citation>Sokol M., Kalabukov S., Kasiyan V. et al. // J. Amer. Ceram. Soc. 2016. V. 99. № 3. P. 802.</mixed-citation></ref><ref id="B30"><label>30.</label><mixed-citation>doi.org/10.1111/jace.14051</mixed-citation></ref><ref id="B31"><label>31.</label><mixed-citation>Lagny M., Böhmler J., Lemonnier S. et al. // Open Ceram. 2024. V. 18. P. 100570.</mixed-citation></ref><ref id="B32"><label>32.</label><mixed-citation>doi.org/10.1016/j.oceram.2024.100570</mixed-citation></ref><ref id="B33"><label>33.</label><mixed-citation>Bigotta S., Galecki L., Katz A. et al. // Opt. Express. 2018. V. 26. № 3. P. 3435.</mixed-citation></ref><ref id="B34"><label>34.</label><mixed-citation>doi.org/10.1364/OE.26.003435</mixed-citation></ref><ref id="B35"><label>35.</label><mixed-citation>Ikesue A., Aung Y.L. // J. Amer. Ceram. Soc. 2017. V. 100. № 1. P. 26.</mixed-citation></ref><ref id="B36"><label>36.</label><mixed-citation>doi.org/10.1111/jace.14588</mixed-citation></ref><ref id="B37"><label>37.</label><mixed-citation>Zhang P., Jiang B., Fan J. et al. // Opt. Mater. Express. 2015. V. 5. № 10. P. 2209.</mixed-citation></ref><ref id="B38"><label>38.</label><mixed-citation>doi.org/10.1364/OME.5.002209</mixed-citation></ref><ref id="B39"><label>39.</label><mixed-citation>Jiang B., Lu X., Zeng Y. et al. // Phys. Stat. Sol. C. 2013. V. 10. № 6. P. 958.</mixed-citation></ref><ref id="B40"><label>40.</label><mixed-citation>doi.org/10.1002/pssc.201300016</mixed-citation></ref><ref id="B41"><label>41.</label><mixed-citation>Kravtsov A.A., Chapura O.M., Tarala V.A. et al. // J. Europ. Ceram. Soc. 2025. V. 45. № 3. P. 117033.</mixed-citation></ref><ref id="B42"><label>42.</label><mixed-citation>doi.org/10.1016/j.jeurceramsoc.2024.117033</mixed-citation></ref><ref id="B43"><label>43.</label><mixed-citation>Lee S., Kupp E.R., Stevenson A.J. et al. // J. Amer. Ceram. Soc. 2009. V. 92. № 7. P. 1456.</mixed-citation></ref><ref id="B44"><label>44.</label><mixed-citation>doi.org/10.1111/j.1551-2916.2009.03029.x</mixed-citation></ref><ref id="B45"><label>45.</label><mixed-citation>Tian F., Chen C., Liu Y. et al. // Opt. Mater. 2020. V. 101. P. 109728.</mixed-citation></ref><ref id="B46"><label>46.</label><mixed-citation>doi.org/10.1016/j.optmat.2020.109728</mixed-citation></ref><ref id="B47"><label>47.</label><mixed-citation>Nie Y., Liu Y., Zhao Y., Zhang M. // Opt. Mater. 2015. V. 46. P. 203.</mixed-citation></ref><ref id="B48"><label>48.</label><mixed-citation>doi.org/10.1016/j.optmat.2015.04.019</mixed-citation></ref><ref id="B49"><label>49.</label><mixed-citation>Xu X., Zhao Z., Zhao G. et al. // J. Crystal Growth. 2003. V. 257. № 3–4. P. 297.</mixed-citation></ref><ref id="B50"><label>50.</label><mixed-citation>doi.org/0.1016/S0022-0248(03)01455-6</mixed-citation></ref><ref id="B51"><label>51.</label><mixed-citation>Wang X., Liu Y., Zhao P. et al. // J. Appl. Phys. 2015. V. 117. № 15. P. 153104.</mixed-citation></ref><ref id="B52"><label>52.</label><mixed-citation>doi.org/10.1063/1.4918550</mixed-citation></ref><ref id="B53"><label>53.</label><mixed-citation>Tang F., Huang J., Guo W. et al. // Opt. Mater. 2012. V. 34. № 5. P. 757.</mixed-citation></ref><ref id="B54"><label>54.</label><mixed-citation>doi.org/10.1016/j.optmat.2011.10.015</mixed-citation></ref><ref id="B55"><label>55.</label><mixed-citation>Jiang N., Ouynag C., Liu Y. et al. // Opt. Mater. 2019. V. 95. P. 109203.</mixed-citation></ref><ref id="B56"><label>56.</label><mixed-citation>doi.org/10.1016/j.optmat.2019.109203</mixed-citation></ref><ref id="B57"><label>57.</label><mixed-citation>Zhang Y., Cai M., Jiang B. et al. // Opt. Mater. Express. 2014. V. 4. № 10. P. 2182.</mixed-citation></ref><ref id="B58"><label>58.</label><mixed-citation>doi.org/10.1364/OME.4.002182</mixed-citation></ref><ref id="B59"><label>59.</label><mixed-citation>Lu Z., Lu T., Wei N. et al. // Opt. Mater. 2015. V. 47. P. 292.</mixed-citation></ref><ref id="B60"><label>60.</label><mixed-citation>doi.org/10.1016/j.optmat.2015.05.043</mixed-citation></ref><ref id="B61"><label>61.</label><mixed-citation>Lapin V.A., Kravtsov A.A., Suprunchuk V. et al. // Opt. Mater. 2024. V. 157. P. 116353.</mixed-citation></ref><ref id="B62"><label>62.</label><mixed-citation>doi.org/10.1016/j.optmat.2024.116353</mixed-citation></ref><ref id="B63"><label>63.</label><mixed-citation>Helle A.S., Easterling K.E., Ashby M.F. // Acta Metall. 1985. V. 33. № 12. P. 2163.</mixed-citation></ref><ref id="B64"><label>64.</label><mixed-citation>doi.org/10.1016/0001-6160(85)90177-4</mixed-citation></ref><ref id="B65"><label>65.</label><mixed-citation>Kwon O.-H., Messing G.L. // Acta Metall. Mater. 1991. V. 39. № 9. P. 2059.</mixed-citation></ref><ref id="B66"><label>66.</label><mixed-citation>doi.org/10.1016/0956-7151(91)90176-2</mixed-citation></ref></ref-list></back></article>
