The effect of two-dimensional phenomena on the bunching of intense electron beams in broadband klystrons

Cover Page

Cite item

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription Access

Abstract

The results of a study of the effect of two-dimensional phenomena on the electron beam bunching in single-beam and multi-beam broadband klystrons are presented. The results of a comparative analysis of beam bunching using a one-dimensional and two-dimensional model are presented. The causes of errors in determining the output parameters of broadband klystrons obtained using one-dimensional programs are analyzed.

About the authors

V. E. Rodyakin

Institute on Laser and Information Technologies of Russian Academy of Sciences, National Research Centre «Kurchatov Institute»

Email: vrodyakin@mail.ru
Moscow, Russia

V. N. Aksenov

Lomonosov Moscow State University

Moscow, Russia

References

  1. Родякин В.Е., Пикунов В.М., Аксенов В.Н. // Журн. радиоэлектрон. 2020. № 12. С. 1
  2. Rodyakin V.E., Pikunov V.M., Aksenov V.N. // J. Radio Electron. 2020. No. 12. Art. No. 14.
  3. Родякин В.Е., Аксенов В.Н. // Вест. Моск. ун-та. Сер. 3. Физ. Астрон. 2021. № 5. С. 70.
  4. www.cst.com
  5. Родякин В.Е., Пикунов В.М., Аксенов В.Н. // Журн. радиоэлектрон. 2019. № 5. С. 1
  6. Rodyakin V.E., Pikunov V.M., Aksenov V.N. // J. Radio Electron. 2019. No. 6. Art. No. 4.
  7. Sandalov A.N., Pikunov V.M., Rodyakin V.E. et al. // KEK report 1/1997. P. 185.
  8. Shen B., Ding Y., Zhang Z. et al. // IEEE Trans. Electron Devices. 2014. V. 61. No. 6. P. 1848.
  9. Zhiqiang Zhang, Jirun Luo, Zhaochuan Zhang et al. // Progr. Electromagn. Res. C. 2020. V. 103. P. 177.
  10. Родякин В.Е., Пикунов В.М., Аксенов В.Н. // Изв. РАН. Сер. физ. 2021. Т. 85. № 1. С. 106
  11. Rodyakin V.E., Pikunov V.M., Aksenov V.N. // Bull. Russ. Acad. Sci. 2021. V. 85. No. 1. P. 83.
  12. Родякин В.Е., Аксенов В.Н. // Изв. РАН. Сер. физ. 2022. Т. 86. № 1. С. 88
  13. Rodyakin V.E., Aksenov V.N. // Bull. Russ. Acad. Sci. 2022. V. 86. No. 1. P. 62.
  14. Канавец В.И., Сандалов А.Н. // Электрон. техн. Сер. 1. Электроника СВЧ. 1971. № 3. C. 11.
  15. Ding Y., Yunshu Zhu, Xiuling Yin et al. // IEEE Trans. Electron Devices. 2007. V. 54. No. 4. P. 624.

Supplementary files

Supplementary Files
Action
1. JATS XML
Download

Copyright (c) 2025 Russian Academy of Sciences