Nuclear scanning microprobe in the study of silicon carbide epilayers

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We presented the results of the study of surfaces of homoepitaxial 4H-SiC layers using a nuclear scanning microprobe in the Rutherford backscattering mode. Analysis of the state of the sample surfaces and synthesis modes showed that an increase in the silicon (Si) content in the upper layers of some samples precedes the formation of highly defective 4H-SiC layers.

作者简介

M. Buzoverya

Russian Federal Nuclear Center — All-Russia Research Institute of Experimental Physics

Email: dismos51@gmail.com
俄罗斯联邦, Sarov, 607188

I. Karpov

Russian Federal Nuclear Center — All-Russia Research Institute of Experimental Physics

Email: dismos51@gmail.com
俄罗斯联邦, Sarov, 607188

A. Arkhipov

Russian Federal Nuclear Center — All-Russia Research Institute of Experimental Physics

Email: dismos51@gmail.com
俄罗斯联邦, Sarov, 607188

D. Skvortsov

National Research Ogarev Mordovia State University

编辑信件的主要联系方式.
Email: dismos51@gmail.com

Research Laboratory “Synthesis and Processing of Silicon Carbide Single Crystals”

俄罗斯联邦, Saransk, 430005

V. Neverov

National Research Ogarev Mordovia State University

Email: dismos51@gmail.com

Research Laboratory “Synthesis and Processing of Silicon Carbide Single Crystals”

俄罗斯联邦, Saransk, 430005

B. Mamin

National Research Ogarev Mordovia State University

Email: dismos51@gmail.com

Research Laboratory “Synthesis and Processing of Silicon Carbide Single Crystals”

俄罗斯联邦, Saransk, 430005

参考

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